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INORGANIC CHEMICAL PRODUCT STANDARDS

The following represent typical manufacturing capabilities and tolerances for Materion Electronic Materials products. All items will be inspected to the tolerances listed below unless further tolerances have been agreed to during the quotation process, or prior to order placement.

PURITY DESIGNATION AND TOLERANCES

  • Typical Purity – Metals Basis
    All of Materion's products (with the exception of the rare earths noted below), or in some cases their precursors, are analyzed by D.C. Arc Emission Spectroscopy, utilizing CID (Charge Injection Device) detection. The typical purities listed are obtained by subtracting from 100% the sum of all trace metals which are detected. Carbon, gaseous elements, other non‐metallic elements (e.g. sulfur, phosphorus, etc.) and elements specifically disclaimed in the product listing are not considered in arriving at the typical purity value.
  • Typical Purity – Rare Earth Oxide Basis
    For all rare earth metals and some oxides, the typical purities listed are based on total rare earth oxide (REO) impurities and are so indicated in the product listing by the notation “(REO basis)”.
  • Phase Purity
    Every substance we produce, with the exception of metals and liquids, is characterized by X‐ray powder diffraction. The resultant diffraction pattern is compared with the standard patterns established by the JCPDS (Joint Committee for Powder Diffraction Standards) of the International Centre for Diffraction Data. We strive to produce compounds which are 100% phase pure wherever practical. The formulas listed represent the major resulting phase, but no guarantee is made that traces of other phases will not be observed with other methods of analysis. When repeated syntheses indicate that more than a single major phase results, or that lesser amounts of additional phases may be consistently observed, we have listed these findings in the formula column. Please inquire before ordering if phase purity is critical to your needs.
  • Elemental Composition and Trace Impurity Analyses
    The elemental composition of our products is determined by appropriate, established methods which may include classical gravimetric or titrimetric procedures, Atomic Absorption Spectroscopy (AAS), and Inductively Coupled Plasma (ICP) Spectroscopy. Trace impurities are determined, or their emission spectrographic results more precisely quantified, by the AAS or ICP spectroscopic techniques. Where relevant, the carbon, sulfur, nitrogen and oxygen content of our products are determined by established ignition procedures.