Literature

Crawford ToughMet Alloy Comparison White Paper
Crawford ToughMet Alloy Comparison White Paper
Effective Hermetic Sealing for Next-Generation Microelectronic Packaging
Reliability is essential for micro-electromechanical systems (MEMS) constantly threatened by environmental, material, and electrical inputs that can disrupt the performance of the entire module.
Efficient Semiconductor Thermal Management
Advanced thermal interface materials are playing a greater role in thermal management for advanced electronics.
Mxology Validation Of Materion Alloys White Paper
Mxology Validation Of Materion Alloys White Paper
Nace Baselining Of Cu Be Alloys White Paper
Stress Corrosion Cracking / Sulfide Stress Cracking Testing in NACE MR0175 and ASTM G36 Environments of CopperBeryllium Alloys
Preview Of Advanced Sucker Rod Coupling Material White Paper
ToughMet Sucker Rod Couplings White Paper
Sustainable Energy Storage: Advanced Materials for Next-Gen Batteries
A Deep Dive into Advanced Materials for Next-Gen Batteries
System Performance of a Lightweight Beryllium Composite Heat Sink for Advanced Electronic Packaging
White paper on using beryllium composite heat sinks for advanced electronic packaging
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